Electrical Analysis system for TEM

​

Analysis system for fast and precise in-situ imaging of electrical activities and defects in TEM  

​

Developed by point electronic, the Electrical Analysis system brings all electrical analysis techniques, including EBIC, RCI, and EBIRCH to the STEM. It ensures high-quality, precise imaging of electronic behaviors and faults and rapid, intuitive analysis and to maximize application versatility.

 

System

​

As a complete solution, all electronics are fully integrated and controlled via software.

  

• REVOLON TEM scan controller and imaging system with highest speed for in-situ STEM, large pixel resolution, second stage digital amplification for EA, and simultaneous BF, HAADF and EA inputs ​

​

• EA Amplifier options for biasing holders for first stage low-noise analog amplification with a wide gain range, built-in voltage bias and current compensation, automated signal routing and zero adjustment, and switchable low-pass filters  ​

​​

• Display Panel with touch display for hardware control ​

​​

• Control app for image acquisition and amplifier control, with color mixing, current-voltage (IV), line scans, inspection and export functions of calibrated image data 

​​​

• microDIP app for advanced image processing 

​

 

To learn more visit Point Electronic >