Angstrom Scientific, Inc.
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In-Situ SEM Nanoindenters
X-Ray Hybrid Pixel Detectors
In-Situ Tensile Stages
Cooling Stages
EDS Systems
EBSD Systems
TEM Cameras
Nanoprobing
Cryo Preparation Systems
RT & Cryo Sample Transfer & Cryo Stages
Cryo CLEM Systems
AFSEM -AFM in-situ SEM
Nano-manipulators
Trimming Systems
Tissue Processor
Optical Nanoscope
EBAC
AFM Cantilevers
Electron Microscopy Detectors
SEM Instrumentation
WDS Systems
Tabletop SEM
Micro CT System
RT & Cryo Ultramicrotomes
Critical Point Drier
Ion Detectors
SEM & TEM Detectors
µXRF Systems
Scanning Electron Microscope
Ion Beam Milling Systems
Contrasting System
Coaters & Freeze Fracturing
Super-Resolution Microsphere Amplifying Lens (SMAL) for optical microscopes
EBIC
Single Crystal Diffractometers
Powder Diffractometers