Electrical Analysis system for SEM

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Analysis system for fast and precise visualization of electrical activities and defects in SEM and FIB/SEM, providing a high application versality 

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Developed by Point Electronic, the Electrical Analysis system enables intuitive, rapid analysis and supports a full range of SEM-based electrical techniques—including EBIC, RCI, and EBIRCH. It ensures high-quality, precise imaging of electronic behaviors and faults while maximizing flexibility for various applications. 

 

System

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• EA Amplifier with built-in voltage bias and current compensation, factory calibrated gains and offsets 

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• ​DISS6 Scan Controller with multi-channel imaging for simultaneous acquisition of EA and other SEM signals, with optional lock-in ​

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• Display Panel with touch display for hardware control ​

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• DISS6 app for acquisition and amplifier control, with color mixing, current-voltage (IV), line scans, inspection and export functions of calibrated image data. ​​

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• microDIP app for advanced image processing 

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To learn more visit Point Electronic >