Get access to streamlined thermal conductivity measurements, from thin film to bulk, using our patented fiber-optic-based steady-state thermoreflectance tool. The automated, high throughput, turn key implementation of SSTR-F can measure the thermal conductivity of materials with values ranging from 0.05 to 500 W/m/K.

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• Absolute measurement of thermal conductivity (no knowledge of heat capacity or density required for analysis).

• Interfacial thermal resistance and thin film measurements from nanometers to microns.

• Automated, rapid, high throughput testing with micron areal resolution. Simplified, user friendly, non-contact approach to thermal conductivity testing.