Angstrom Scientific is a distributor of innovative solutions for microscopy from these leading companies:
Tabletop SEM and Compact AFM
Hitachi was the first to bring tabletop electron microscopy to materials and life sciences research with a sophisticated, yet easy to use solution. Since its introduction in 2005, the Hitachi TM Series electron microscope has led this class with imaging and analysis innovations that have closed the gap between tabletop and traditional SEM. And for more than 30 years, Hitachi has been a leading supplier of flexible, high performance AFM instruments.
Imina Technologies is a Swiss manufacturer of robotic solutions for electron and light microscopes used for electrical nanoprobing and failure analysis in semiconductor, as well as nano-manipulation for research in materials science and physics.
Deben is a precision engineering company from the UK, which specializes in the field of tensile testing, motion control and specimen cooling for microscopy applications.
EM Sample Prep
Leica Microsystems is a world leader in providing innovative microscopy, camera and software solutions for imaging and analysis of macro-, micro- and nanostructure.
Micro CT System
KA Imaging designs and develops X-ray and micro CT-imaging products for medical, NDT and veterinary industries
AFSEM -AFM in-situ SEM
GETec Microscopy offers innovative Atomic Force Microscopy solutions for seamless integration into existing host systems like Scanning Electron Microscopes. In partnership with their customers, they develop dedicated nano analysis tools based on pre-engineered modules.
Integrated Cameras for X-ray, Electron and Ion Detection
ASI offers state-of-the-art camera systems based on Medipix technology developed in collaboration with CERN. These cameras have a 2D array of “smart pixels” that can measure the energy of an incoming charge. The cameras can be custom built into many different experiments for multiple applications.
Started 1st of June 2015 the EMSIS GmbH, located in Münster Germany, is the successor of the well-known Olympus Soft Imaging Solutions (OSIS) GmbH EMIC product group.
EMSIS will continue with the entire scope of the EMIC business, from selling known and new EM imaging products to the support of existing products and installations worldwide.
The offered product range includes the previous OSIS TEM camera models, imaging software for SEM and TEM, services and training.
Ex Situ Lift Out Systems
Lucille Giannuzzi exploited "lift out" in the mid to late 1990's after a light bulb went on the first time she saw a FIB being used for TEM specimen preparation of semiconductor materials. The technique subsequently known as ex situ lift out was used for a wide range of materials. After starting her own consulting and service business in 2010, Lucille revisited the ex situ lift out technique and developed added flexibility with a patented* grid design and method named EXpressLO™. She started offering ex situ lift out solutions including EXpressLO™ in 2012.
In-Situ SEM NanoIndenter
Alemnis offers state-of-the-art nanoindentation technology for academia and industry. The Alemnis instruments are compact, robust, versatile and can be fitted to various kinds of microscopes such as Scanning Electron Microscopes (SEM), light microscopes, Synchrotron beamlines, and many more.
SCL-Sensortech focuses on the improvement of next generation atomic force microscopy (AFM) cantilevers.
Novel Optical Microscope
LIG Nanowise builds microsphere enabled lenses. They use spheres smaller than the width of a human hair to push the boundaries of scientific optics. Their microsphere lenses function like optical amplifiers, increasing the power of any light passes through them. LIG Nanowise uses them in objective lenses for microscopes, and in arrays for high-precision nano-patterning for advanced surface manufacturing.
Powder Diffractometry and Single Crystal Diffractometry
STOE, originally founded in 1887, to manufacture equipment for the optical analysis of crystals, has been a pioneer in powder and single crystal X-ray diffraction since the 1960’s, e.g. STOE invented and patented the transmission geometry technique for Powder XRD as well as, for single crystals, produced the first pixel detector XRD system with an open Eulerian cradle.
Stoe now offers an industry leading, unparalleled 10 YEAR, parts and labor guarantee.
TEM specimen holders and transfer cartridges
Mel-Build was founded in 2005 to address holder and accessories needs for 3D and 4D TEM tomography applications. In partnership with Kyushu University, Mel-Build continues to develop user-friendly technology solutions to advance the applications for TEM in materials science and nanotechnology.