Angstrom Scientific is a distributor of innovative solutions for microscopy from these leading companies:
In-Situ SEM NanoIndenter
Alemnis offers state-of-the-art nanoindentation technology for academia and industry. The Alemnis instruments are compact, robust, versatile and can be fitted to various kinds of microscopes such as Scanning Electron Microscopes (SEM), light microscopes, Synchrotron beamlines, and many more.
Integrated Cameras for X-ray, Electron and Ion Detection
ASI offers state-of-the-art camera systems based on Medipix technology developed in collaboration with CERN. These cameras have a 2D array of “smart pixels” that can measure the energy of an incoming charge. The cameras can be custom built into many different experiments for multiple applications.
Deben is a precision engineering company from the UK, which specializes in the field of tensile testing, motion control and specimen cooling for microscopy applications.
Started 1st of June 2015 the EMSIS GmbH, located in Münster Germany, is the successor of the well-known Olympus Soft Imaging Solutions (OSIS) GmbH EMIC product group.
EMSIS will continue with the entire scope of the EMIC business, from selling known and new EM imaging products to the support of existing products and installations worldwide.
The offered product range includes the previous OSIS TEM camera models, imaging software for SEM and TEM, services and training.
Tabletop SEM and FlexSEM I000 II
Hitachi was the first to bring tabletop electron microscopy to materials and life sciences research with a sophisticated, yet easy to use solution. Since its introduction in 2005, the Hitachi TM Series electron microscope has led this class with imaging and analysis innovations that have closed the gap between tabletop and traditional SEM.
With the highest in-class resolution of 4 nm, the FlexSEM 1000 II offers user-friendly operation and sophisticated automatic functions for a wide range of users, from beginners to experts.
Imina Technologies is a Swiss manufacturer of robotic solutions for electron and light microscopes used for electrical nanoprobing and failure analysis in semiconductor, as well as nano-manipulation for research in materials science and physics.
Micro CT System
KA Imaging designs and develops X-ray and micro CT-imaging products for medical, NDT and veterinary industries
EM Sample Prep
When it comes to great results, stunning performance or breakthrough discoveries, you will find one thing that all of them have in common: their precise and careful preparation.
In the field of electron microscopy, perfect sample preparation is a prerequisite and crucial step. Leica Microsystems offers a comprehensive product portfolio for preparation of biological, medical and industrial samples. Concentrating on workflow solutions we provide a product range that is perfectly aligned to all your needs for precise sample preparation in TEM, SEM, and AFM investigations. Each Leica solution consists of several instruments that are perfectly geared to one another to form a seamless workflow for your sample.
Be prepared – for great results in EM Sample Preparation!
Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
NenoVision has developed an atomic force microscope (AFM) LiteScope™ designed for fast and easy integration into scanning electron microscopes (SEMs).
EBAC & EBIC
Over 20 years of innovation and service in digital image acquisition for electron microscopy
Point Electronic GmbH provides innovative electronics and software for Scanning Electron Microscopy (SEM) and micro-analysis tools. Providing both the best quantitative electronics and software for Electron Beam Induced Current (EBIC) and the lowest noise Electron Beam Absorbed Current (EBAC) and Resistive Contrast Imaging (RCI) system.
Powder Diffractometry and Single Crystal Diffractometry
STOE, originally founded in 1887, to manufacture equipment for the optical analysis of crystals, has been a pioneer in powder and single crystal X-ray diffraction since the 1960’s, e.g. STOE invented and patented the transmission geometry technique for Powder XRD as well as, for single crystals, produced the first pixel detector XRD system with an open Eulerian cradle.
Stoe now offers an industry leading, unparalleled 10 YEAR, parts and labor guarantee.