Angstrom Scientific, Inc.

  • Home

  • Companies

  • Products

    • AFSEM - AFM in-situ SEM
    • Coaters & Freeze Fracture Systems
    • Contrasting System
    • Cooling Stages
    • Critical Point Drier
    • Cryo CLEM Systems
    • Cryo Preparation
    • EBIC
    • EBAC
    • EBSD Systems
    • EDS Systems
    • FlexSEM
    • Hybrid Pixel Detectors
    • In-Situ SEM NanoIndenter
    • In-Situ Tensile Stages
    • Ion Beam Milling Systems
    • Micro CT System
    • Micro XRF Systems
    • Nano-manipulators
    • Nanoprobing
    • Powder X-ray Diffractometers
    • RT & Cryo Sample Transfer Systems
    • RT & Cryo Ultramicrotomes
    • Self-Sensing Cantilevers
    • SEM Instrumentation
    • SEM & TEM Detectors
    • Single Crystal X-ray Diffractometers
    • Tabletop SEM
    • TEM Cameras
    • Tissue Processor
    • Trimming Systems
    • WDS Systems

  • Used Microscopes

  • About Us

    • Upcoming Events
    • Careers
    • News

  • Contact

  • More

    Micro-XRF Systems

    logo-edax.png
    orbis_icon
    orbis_icon

    orbis_pc_icon
    orbis_pc_icon

    vision_software_icon
    vision_software_icon

    orbis_icon
    orbis_icon

    1/4

    • Orbis Micro-XRF Analyzers

    • Orbis MC Micro-XRF Analyzer

    • Orbis PC Micro-XRF Analyzer

    • ​Orbis Vision Software

    ​

    To learn more visit EDAX >

    © 2020 Angstrom Scientific, Inc.