Ion Beam Milling Systems

Ion Beam Milling System Leica EM TIC 3X

 

Achieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage was never before more convenient than now, using the Leica EM TIC 3X.

 
 
 
 

 

 

 

 

 

 

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