AFSEM - AFM in-situ SEM
AFSEM® is an AFM by GETec Microscopy, designed for integration into an SEM or Dualbeam (SEM/FIB) microscope. It’s open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.
AFSEM uses SCL's self-sensing cantilevers provided by their partner company SCL-Sensor.Tech.