AFSEM -AFM in-situ SEM

GETec

AFSEM® is an AFM by GETec Microscopy, designed for integration into an SEM or Dualbeam (SEM/FIB) microscope. It’s open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.

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AFSEM uses SCL's self-sensing cantilevers provided by their partner company SCL-Sensor.Tech.

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