Imina Technologies’ Nanoprobing SEM Solutions are turnkey for electrical characterization of microelectronic devices and in situ semiconductor failure analysis.
Up to 8 miBot™ nanoprobers can be delivered in various configurations to adapt to customer applications requirements and equipment. The miBot™ —our famously easy-to-use and versatile piezoactuated micro robots— allows you to position the probes over millimeter scale samples with a resolution down to the nanometer. The 4 degrees of freedom of these nanoprobers enables the operator to easily adjust the orientation of probes in situ during experiment.
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